fault coverage中文是什么意思

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中文翻译
造句

故障范围
故障覆盖率
故障概括率
故障检测范围；错误检测范围
故障识别比

fault n. 1.过失，过错；罪过，责任。 2.缺点，缺陷，瑕疵 ...
coverage n. 范围，规模，总额；〔美国〕保险额；保证金，现金准备 ...
coverage fault 故障检测范围
coverage n. 范围，规模，总额；〔美国〕保险额；保证金，现金准备；〔美国〕(新闻)报导(范围)；【植物；植物学】优势度。 coverage diagram 【航空】搜索范围。
at fault 感到困惑, 有故障; 有错; 有过失; 有毛病; 罪有应得
fault n. 1.过失，过错；罪过，责任。 2.缺点，缺陷，瑕疵。 3.(猎狗的)失去嗅迹。 4.【电学】故障，误差；漏电；【地质学；地理学】断层。 5.【网球】发球出界；犯规。 Faults are thick where love is thin. 〔谚语〕一朝情义淡，样样不顺眼。 fault detection 【机械工程】探伤。 The fault is his own. 这是他自己的错。 a grave fault in a theory 理论上的重大缺陷。 a fault in the machine 机械故障。 image fault 【物理学】像差，影像失真。 numerical faults 数值误差。 a fault on the right side 因祸得福。 be at fault 1. (猎犬追捕猎物等时)失去嗅迹，踌躇不前；不知所措，正在为难。 2. 出毛病，有故障。 3. ＝ in fault (My memory is at fault . 我想不起来了)。 find fault in 看出…缺点。 find fault with 找…的岔子。 have no fault to find with 无错可寻。 hit off a fault (猎狗)闻出(曾一度错失的)嗅迹。 in fault 有过错，有责任 (Who is in fault 是谁的不是？)。 to a fault 过度，极端 (He is kind to a fault. 他过分老实)。 whip a fault out of sb. 鞭打某人使之改过。 with all faults 不保证商品没有缺点。 without fault 〔古语〕无误，确实。 vi. 1.【地质学；地理学】产生断层；有断层余迹。 2.发球出界；犯规。 3.〔方言〕责备，挑剔。 4.〔古语〕犯错误，做错。 vt. 1.找…的岔子，挑剔；〔方言〕责备。 2.【地质学；地理学】使产生断层。 3.把…做错。 He faulted my speech in two ways. 他认为我的讲话有两点不妥。 fault one's performance 表演发生失误。
in fault 有过错
no fault 无过失
to a fault 过分地
increasing coverage extending coverage 保险凭证
absorbent coverage 吸收性复盖层
acquisitionn coverage 探测范围
addition coverage 附加覆盖
additional coverage 增加承保范围
aerial coverage 航摄范围
air coverage 航空摄影范围
aircraft coverage 航天器感测范围
airphoto coverage 航空摄影范围
ambulance coverage 救护服务覆盖范围
angle coverage 镜头取景角度
angle of coverage 视场角; 视角
angular coverage 覆盖角; 扇形作用区; 视界
antibiotic coverage 抗生素作用范围
anticoagulant coverage 抗凝剂作用范围
area coverage 覆盖面积; 覆盖区域; 区域范围

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例句与用法

As an enhancement of these methods , current testing can increase the fault coverage and make higher the reliability of ics
作为这些方法的一个补充，电流测试方法能够提高故障的覆盖率，提高产品的可靠性。
And , when coupled with functional testing , the fault coverage for the entire process is as good as or better than in - circuit testing alone
加上功能测试，这个过程中检测到的故障率要比单独进行在线测试故障发现率大。
The transient power supply current ( iddt ) testing can detect some faults undetectable by any other test method , and increase fault coverage
瞬态电流测试方法可以测试一些其他测试方法无法检测的故障，进一步提高故障覆盖率。
Through the simulative experiments about iddq detecting bridge faults in cmos and bicmos circuits , the fault coverage of iddq can be estimated
并对cmos电路与bicmos电路的桥接故障作了iddq检测仿真实验,分析了iddq检测的故障覆盖率。
In this paper we use the bist in the testing of the ssrams in estarl according to the characteristics of the structure and get almost 100 % fault coverage
本文针对estar1内部ssram的结构特点，实现了存储器自测试，得到了将近100的故障覆盖率。
Because most of the faults found at board test are manufacturing defects , fault coverage for mda tests is nearly as good as fault coverage for in - circuit tests
因为在板级测试中发现的大部分故障都是生产缺陷，生产缺陷分析测试到的故障几乎都可以覆盖在线测试所发现的问题。
The conclusion is that by using ant algorithm , the fault coverage about near half standard circuits is best ; and the generation speed is very higher than strategate ' s
与现有测试生成器相比，基于蚂蚁算法的测试矢量生成结果中，有近一半的标准电路获得了最高的故障覆盖率；在生成速度方面远高于strategate等算法。
The dynamic power supply current ( iddt ) is a new window through which we can observe the switching activities in digital circuits . iddt testing methods make possible further increasing the fault coverage
动态电流提供了一个观测电路内部开关性能的新的窗口，动态电流测试方法为进一步提高故障覆盖率提供了可能。
The experimental results illuminate the hierarchical test generation algorithm can greatly decrease the scale of test sets ( about 66 % ) , but the fault coverage and time performance are lower than gate - level test generation
实验数据表明分层测试产生算法能大大压缩电路测试集（约为66 ），而故障覆盖率有略微下降，时间性能也有些许降低。
These new methods adopt the circuit information contained in the power supply line current to realize the fault diagnosis . it can increase the fault coverage , reduce testing cost and improve the quality and reliability of ics
它通过从电源电流信号中提取有效的信息来进行故障诊断,能够提高故障覆盖率,降低测试成本并提高集成电路产品的质量与可靠性。

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百科解释

Fault coverage refers to the percentage of some type of fault that can be detected during the test of any engineered system. High fault coverage is particularly valuable during manufacturing test, and techniques such as Design For Test (DFT) and automatic test pattern generation are used to increase it.

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